Scanning electron microscopy (SEM) depends on a focused electron beam scanned over the surface of a sample. When the beam hits the sample surface, electrons are emitted from a very shallow area around the beam impact point. SEM provides detailed topographic images of the surfaces of cells, tissue and whole organisms that is not possible with TEM.
LBICs Jeol JSM-7800F SEM is equipped with secondary and backscatter detectors for both high and low vacuum work. This makes it possible to study both the topography (secondary electrons) and detect contrast between areas with different atomic compositions (backscatter electrons), for example, the surface distribution of electron dense immuno-labels (nanogold or Quantum dots). Working under low vacuum allows non-conductive samples (e.g. biological samples) to be examined with minimal preparation work. The microscope is also equipped with a retractable STEM detector (Scanning Transmission Electron Microscopy) that allows us to image thin, electron transparent samples with sub nanometer resolution.